X-ray Laboratory

Bruker D8 DISCOVERY X-ray diffractometer/reflectometer system with the following options

• Diffraction
• Grazing incidence diffraction
• Reflectivity
• Wide temperature range, 80 up to 1873 K for diffraction, up to 1100 K for reflectivity
• 1D position sensitive VANTEC detector

It is used for the investigation of

• The crystalline structure of materials in bulk, powder or film form
• Phase formation
• In-situ kinetic studies for phase transformations
• Micro-stress determination
• Grain size determination of nano-structured materials (<500 µm)
• Layered structure (density, thickness, roughness) of films and multilayers

X-ray fluorescence spectrometer equipped with

• Ag X-ray tube (50 kV, 200 µA)
• Solid state detector with thermoelectric cooling
• Optical components for beam collimation
• Automated XYZ sample platform

having an energy resolution of 0.14 keV.

It is used for the determination of stoichiometric elemental analysis of materials. XRF detects elements with Z>11 with ppm detection limit.